报告题目：应用原子力显微镜实现纳米尺度定量物性测量—PeakForce Tapping 的物理原理解析 

报告人：Chanmin Su 博士（Senior Director of Technology, Bruker Nano AFM Business） 

报告时间：2017年3月6日(星期一) 下午3:00 

地点：国家纳米科学中心 南楼3层会议室 

邀请人：裘晓辉研究员

报告人简介：

Chanmin Su received PhD degree from Chinese Academy of Science,  joined Veeco in 2000 as a senior staff scientist to develop AFM systems and served as Director of Research during 2005-2008. He is currently Senior Director of Technology at Bruker Nano AFM Business. 

Chanmin Su is inventor/co-inventor of 34issued US patents on AFM technologies and material characterization at nanometer scales, including Peak Force Tapping, Fastscan AFM, nanoscale mechanical, electric and chemical mappings. Many of these inventions led to break through products, such as PeakForce tapping and PeakForce QNM. He was co-organizer of several international conferences on scanning probe microscopy and chaired sessions in scanning probe-related international conferences. Chanmin Su has served as a panelist for a few national and international reviews on future technologies and has given many invited speeches to various international scientific events. Chanmin Su has received service awards from NASA administrator in 2000, R&D 100 award in 2002, 2012 Innovation award by Microscopy Today.