报告人简介： 

After joining NPL in 2009, Andrew is now leading the Surface and Nanoanalysis Group's research into the structural and chemical characterisation of graphene and related 2D materials, with a focus on enabling industrial commercialisation in this area. This metrology research addresses the actual measurement of 2D materials with a range of surface characterisation techniques, such as Raman spectroscopy and tip-enhanced Raman spectroscopy (TERS), scanning probe microscopies (SPM), scanning electron microscopy (SEM), secondary ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS). 

Andrew is a member of the ISO working group ‘Measurement and Characterisation’ within the ‘Nanotechnologies’ Technical Committee (TC229), and a UK nominated expert for the international standards currently in development in ISO/TC229 and IEC/TC113. As part of his role as the Industry Standardisation Leader at the NGMC, he is leading two international graphene standards within ISO/TC229 and heavily engaged with companies around the world producing or using graphene. Andrew is a Visiting Academic at the National Graphene Institute (NGI) at the University of Manchester, the co-chair of the VAMAS Technical Working Area ‘TWA 41: Graphene and Related 2D Materials’ and is on the advisory board of several graphene entities.